发明名称 |
PATTERN FORMING METHOD AND ELECTRIC ELEMENT FABRICATING METHOD USING THE SAME |
摘要 |
PURPOSE: A pattern forming method and an electric element fabricating method using the same are provided to crystallize a part of amorphous state ITO(Indium Tin Oxide), form a crystallization state ITO layer, and form a pattern of an etching object layer by the etching selection rate difference of the amorphous state and the crystallization state. CONSTITUTION: An etching object layer is formed on a substrate(101). An amorphous state ITO layer is formed on the etching object layer. A partial region of the amorphous state ITO layer is crystallized. The amorphous state ITO layer is etched to form a crystallized ITO pattern(110a). The etching object layer is etched in a state in which the etching object layer is blocked by the crystallized ITO pattern.
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申请公布号 |
KR20040089332(A) |
申请公布日期 |
2004.10.21 |
申请号 |
KR20030023051 |
申请日期 |
2003.04.11 |
申请人 |
LG.PHILIPS LCD CO., LTD. |
发明人 |
CHAE, GI SEONG;CHO, GYU CHEOL;HWANG, YONG SEOP |
分类号 |
G02F1/13;(IPC1-7):G02F1/13 |
主分类号 |
G02F1/13 |
代理机构 |
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