发明名称 Semiconductor device having capacitor formed in multilayer wiring structure
摘要 A semiconductor device having a capacitor formed in a multilayer wiring structure, the semiconductor device comprising a multilayer wiring structure including a plurality of wiring layers formed on a substrate, a capacitor arranged in a predetermined wiring layer in the multilayer wiring structure and having a lower electrode, a dielectric film, and an upper electrode, a first via formed in the predetermined wiring layer and connected to a top surface of the upper electrode of the capacitor, and a second via formed in an overlying wiring layer stacked on the predetermined wiring layer, the second via being formed on the first via.
申请公布号 US2004207043(A1) 申请公布日期 2004.10.21
申请号 US20030626592 申请日期 2003.07.25
申请人 MATSUNAGA TAKESHI;NAKASHIMA YUICHI;MIYAMOTO KOJI 发明人 MATSUNAGA TAKESHI;NAKASHIMA YUICHI;MIYAMOTO KOJI
分类号 H01L21/768;H01L21/02;H01L21/822;H01L21/8234;H01L23/522;H01L27/04;H01L27/06;H01L27/088;(IPC1-7):H01L29/00 主分类号 H01L21/768
代理机构 代理人
主权项
地址