摘要 |
A test emulation device has test module emulation portions for emulating test modules that generate test signals based on different cycle frequencies, a synchronous emulation portion for generating a test signal generation timing that is to spuriously generate a test signal corresponding to cycle time of the test module emulation portions, a timing aligning portion for aligning, in time-order, test signal generation timings generated by the synchronous emulation portion and sequentially outputting them, and a schedule portion for causing a test module emulation portion corresponding to one test signal generation timing outputted by the timing aligning portion to spuriously generate a test signal in the cycle time corresponding to the one test signal generation timing. |
申请人 |
ADVANTEST CORPORATION;HIGASHI, SHINSAKU;ICHIYOSHI, SEIJI;PRAMANICK, ANKAN;ELSTON, MARK;CHEN, LEON;SAUER, ROBERT;KRISHNASWAMY, RAMACHANDRAN;SINGH, HARSANJEET;ADACHI, TOSHIAKI;TAHARA, YOSHIHUMI |
发明人 |
HIGASHI, SHINSAKU;ICHIYOSHI, SEIJI;PRAMANICK, ANKAN;ELSTON, MARK;CHEN, LEON;SAUER, ROBERT;KRISHNASWAMY, RAMACHANDRAN;SINGH, HARSANJEET;ADACHI, TOSHIAKI;TAHARA, YOSHIHUMI |