发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To measure an output current of a driver in a short time while using an existing LSI tester in inspection of a semiconductor integrated circuit including the driver for outputting a driving current corresponding to the gradation of an image to a display. SOLUTION: The semiconductor integrated circuit is provided with the driver 11 for supplying an electric current for the current drive type display via an output terminal; a resistor 15 in which a prescribed potential is supplied for one end; a switch 16 connected between the other end of the resistor and the output terminal; and a control circuit 18 for controlling the driver and the switch. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004294093(A) 申请公布日期 2004.10.21
申请号 JP20030083091 申请日期 2003.03.25
申请人 SEIKO EPSON CORP 发明人 SANO MASATOSHI
分类号 G01R31/28;(IPC1-7):G01R31/28 主分类号 G01R31/28
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