| 摘要 |
PROBLEM TO BE SOLVED: To provide a property evaluation device capable of evaluating a modulation characteristic of an optical device directly and highly precisely. SOLUTION: The property evaluation device is constituted of a light source 1 for emitting light rays of wave lengthλa, a light source 2 for emitting light rays of wave lengthλb, controllers 3, 4 for controlling polarization of the light rays from the light source 1, 2, a light multiplexer 5 for multiplexing the light rays from the controllers 3, 4, a light ray demultiplexer 6 for demultiplexing the light rays from the light multiplexer 5 into light paths La, and Lb, a frequency modulator 7 disposed on the light path La; a device 8 to be measured placed on the light path Lb; a light multiplexer 9 for multiplexing the light rays from the frequency modulator 7 and the device 8 to be measured; a wave length demultiplexer 10 for demultiplexing the light rays from the light multiplexer 9 corresponding to the wave length; optical detectors 11, 12 for detecting the demultiplexed light rays; and a phase discrimination detector 21 for detecting amplitudes and phase differences regarding a reference signal Sa of the optical detector 11 and an evaluation signal Sb of the optical detector 12. COPYRIGHT: (C)2005,JPO&NCIPI
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