发明名称 DIODE
摘要 PROBLEM TO BE SOLVED: To provide a diode which can be restrained from rising locally in temperature even when an ESD voltage is applied and has a high ESD resistance. SOLUTION: A diode 100 is equipped with a first conductivity-type impurity diffusion region 30, and a second conductivity-type impurity diffusion region 40 on the surface layer of a semiconductor substrate 1. A pn junction is formed in an adjoining area between the first conductivity-type impurity diffusion region 30 and the second conductivity-type impurity diffusion region 40. The peak position Rc of impurity concentration in the first conductivity-type impurity diffusion region 30 and/or the second conductivity-type impurity diffusion region 40 is located at a position deeper than the surface of the semiconductor substrate 1. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004296664(A) 申请公布日期 2004.10.21
申请号 JP20030085520 申请日期 2003.03.26
申请人 DENSO CORP 发明人 OHIRA SATOSHI
分类号 H01L27/04;H01L21/822;H01L29/866;(IPC1-7):H01L29/866 主分类号 H01L27/04
代理机构 代理人
主权项
地址