发明名称 CAM circuit with radiation resistance
摘要 A CMOS CAM circuit an array of CAMs formed on a p-type substrate. Each CAM cell includes a logic portion and an SRAM cell, both having at least one n-channel transistor formed in a p-type well on the p-type substrate. An n-type doped layer is formed between the p-type well region and the p-substrate. The doped layer and well region are maintained at a voltage potential that is between a threshold voltage and a breakdown voltage defined the PN junction formed at their interface. The resulting structure attracts electron-hole pairs formed by alpha particles, thereby preventing soft errors. Alternatively, the logic portions and SRAM cells have p-channel transistors formed in n-type wells on an n-type substrate, and a p-type doped layer is formed between the n-type well region and the n-substrate.
申请公布号 US2004208034(A1) 申请公布日期 2004.10.21
申请号 US20040845654 申请日期 2004.05.13
申请人 INTEGRATED DEVICE TECHNOLOGY, INC. 发明人 LIEN CHUEN-DER
分类号 G11C5/00;G11C15/04;(IPC1-7):G11C15/00 主分类号 G11C5/00
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