发明名称 |
SEMICONDUCTOR DEVICE AND PRODUCTION METHOD THEREFOR |
摘要 |
<p>A simplified method of producing a multi-voltage semiconductor integrated circuit device. A method of producing a semiconductor device comprising (a) the step of forming a first gate insulation film with a first thickness in the first area of a semiconductor substrate, (b) the step of forming a second gate insulation film with a second thickness smaller than the first thickness in the second area of the semiconductor substrate, (c) the step of forming a gate electrode on the first and second gate insulation films with the first and second gate insulation films an the first and second areas kept unremoved, (d) the step of ion-implanting impurities into the first and second areas via the first and second gate insulation films to add impurities with a first low concentration to the first area and those with a second low concentration higher the first low concentration to the second area, (e) the step of removing the first and second gate insulation films in at least contact-forming areas, and (f) the step of adding high-concentration impurities to areas including the contact-forming areas in the first and second areas.</p> |
申请公布号 |
WO2004090983(A1) |
申请公布日期 |
2004.10.21 |
申请号 |
WO2003JP04326 |
申请日期 |
2003.04.04 |
申请人 |
FUJITSU LIMITED;ASANO, MASAYOSHI;NOMURA, TOSHIO;EMA, TAIJI |
发明人 |
ASANO, MASAYOSHI;NOMURA, TOSHIO;EMA, TAIJI |
分类号 |
H01L21/8238;(IPC1-7):H01L27/088 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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