发明名称 SPUTTER ETCH METHOD AND METAL PLUG OF SEMICONDUCTOR DEVICE USING THE SAME TO REDUCE INTERFACE CONTACT RESISTANCE OF CONTACT HOLE
摘要 PURPOSE: A sputter etch method and a metal plug of a semiconductor device using the same are provided to reduce interface contact resistance of a contact hole by conditioning a sputter etch chamber before sputter etching. CONSTITUTION: A dummy substrate(220) is loaded on a wafer chuck(210) of a sputter etch chamber(200). By conditioning the sputter etch chamber, particles(140) attaching at inner walls of the chamber are removed. Then, an etch target substrate is loaded in the sputter etch chamber. The sputter etch target substrate is etched by sputtering.
申请公布号 KR20040088282(A) 申请公布日期 2004.10.16
申请号 KR20030022409 申请日期 2003.04.09
申请人 DONGBUANAM SEMICONDUCTOR INC. 发明人 HAN, JAE WON
分类号 H01L21/302;(IPC1-7):H01L21/302 主分类号 H01L21/302
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