发明名称 METHOD FOR FORMING SEMICONDUCTOR DEVICE WITH CAPACITOR TO PREVENT DEGRADATION OF DIELECTRIC FILM
摘要 PURPOSE: A method for forming a semiconductor device with a capacitor is provided to prevent degradation of a dielectric film by performing diffusion plasma annealing after depositing the dielectric film. CONSTITUTION: A lower electrode(112a) is formed on a semiconductor substrate(101). A pretreatment layer(114) is formed on the lower electrode by using a rapid thermal nitridation method, a rapid thermal oxidation method or chemical vapor deposition method. A dielectric film is deposited on the resultant structure. By performing diffusion plasma annealing, an annealed dielectric film(116a) is formed.
申请公布号 KR20040088172(A) 申请公布日期 2004.10.16
申请号 KR20030022285 申请日期 2003.04.09
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, GI CHEOL;KIM, SEONG TAE;KIM, YEONG SEON;KWON, THOMAS JONG WAN;LIM, JAE SUN;NAM, GAP JIN
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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