发明名称 |
METHOD FOR FORMING SEMICONDUCTOR DEVICE WITH CAPACITOR TO PREVENT DEGRADATION OF DIELECTRIC FILM |
摘要 |
PURPOSE: A method for forming a semiconductor device with a capacitor is provided to prevent degradation of a dielectric film by performing diffusion plasma annealing after depositing the dielectric film. CONSTITUTION: A lower electrode(112a) is formed on a semiconductor substrate(101). A pretreatment layer(114) is formed on the lower electrode by using a rapid thermal nitridation method, a rapid thermal oxidation method or chemical vapor deposition method. A dielectric film is deposited on the resultant structure. By performing diffusion plasma annealing, an annealed dielectric film(116a) is formed.
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申请公布号 |
KR20040088172(A) |
申请公布日期 |
2004.10.16 |
申请号 |
KR20030022285 |
申请日期 |
2003.04.09 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
KIM, GI CHEOL;KIM, SEONG TAE;KIM, YEONG SEON;KWON, THOMAS JONG WAN;LIM, JAE SUN;NAM, GAP JIN |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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