发明名称 SEMICONDUCTOR DEVICE AND ITS MANUFACTURING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a single crystal and a polycrystal having proper crystallinity at low temperature and to provide a semiconductor device having high reliability by using a solid phase growing method. SOLUTION: In order to deposit an amorphous semiconductor thin film on a substrate or an insulating film, particularly, the amorphus semiconductor thin film is formed so that a mean atomic interval distribution of the amorphous film made of a main element constituting the film substantially coincides with that of the single crystal, recrystallization energy is imparted to the amorphous semiconductor thin film, and a solid phase growth is performed to form a single crystal semiconductor thin film 3. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004289169(A) 申请公布日期 2004.10.14
申请号 JP20040139906 申请日期 2004.05.10
申请人 TOSHIBA CORP 发明人 OKADA TAKAKO;KANBAYASHI SHIGERU;YABUKI SO;ONGA SHINJI;TSUNASHIMA YOSHITAKA;MIKATA YUICHI;OKANO HARUO
分类号 H01L21/331;H01L21/20;H01L21/329;H01L21/822;H01L21/8234;H01L21/8249;H01L27/04;H01L27/06;H01L27/08;H01L27/088;H01L29/732;H01L29/78;(IPC1-7):H01L21/329;H01L21/823;H01L21/824 主分类号 H01L21/331
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