发明名称 METHOD TO IMPROVE STI NANO GAP FILL AND MOAT NITRIDE PULL BACK
摘要 PROBLEM TO BE SOLVED: To provide a method to reduce oxide growth on STI walls by depositing and etching a nitride liner to create a thin side wall prior to the STI liner oxidation and to provide a method to make the moat nitride pull back process possible in the present of the STI nitride liner process for STI stress reduction by depositing and etching a nitride liner to create a thin side wall nitride prior to the filling of a STI gap. SOLUTION: The method of improving STI gap fill and moat nitride pull back is provided by after the steps of growing a pad oxide 14, depositing a nitride layer 18 on the pad oxide and the steps of moat patterning, moat etching and moat clean, the steps of growing thermal oxide, deglazing a part of the moat nitride; depositing a thin nitride liner, etching the nitride to form a thin side wall nitride in the STI trench; and performing oxide film deglazing by hydroflouric (HF) acid before STI liner oxidating and depositing oxide to fill the trench. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004288965(A) 申请公布日期 2004.10.14
申请号 JP20030080426 申请日期 2003.03.24
申请人 TEXAS INSTRUMENTS INC 发明人 MEHRAD FREIDOON;CHEN ZHIHAO;MANSOORI MAJID M
分类号 H01L21/76;(IPC1-7):H01L21/76 主分类号 H01L21/76
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