发明名称 LITHOGRAPH SYSTEM AND PROCESS FOR FABRICATING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a lithograph projector being employed effectively in both DUV and EUV lithographs and having a means for controlling molecular contamination in situ. SOLUTION: The lithograph projector comprises a mechanism for supplying a projection radiation beam, a structure supporting a member for patterning the projection beam according to a desired pattern, and a mechanism for projecting a patterned beam to a target part of a substrate. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004289117(A) 申请公布日期 2004.10.14
申请号 JP20030374968 申请日期 2003.09.29
申请人 ASML NETHERLANDS BV 发明人 KURT RALPH;KOLESNYCHENKO ALEKSEY
分类号 G03F7/20;H01L21/027;(IPC1-7):H01L21/027 主分类号 G03F7/20
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