发明名称 |
Generalized fault model for defects and circuit marginalities |
摘要 |
A generalized fault model. For one aspect, extracted faults may be modeled using a fault model in which at least one of the following is specified: multiple fault atoms, two or more impact conditions for a first set of excitation conditions, a relative priority of fault atoms within a set of fault atoms used to model the at least one extracted fault, a dynamic fault duration, and excitation conditions including at least a first mandatory excitation condition and at least a second optional excitation condition.
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申请公布号 |
US2004205436(A1) |
申请公布日期 |
2004.10.14 |
申请号 |
US20040836163 |
申请日期 |
2004.04.29 |
申请人 |
KUNDU SANDIP;SENGUPTA SANJAY;GOSWAMI DHIRAJ |
发明人 |
KUNDU SANDIP;SENGUPTA SANJAY;GOSWAMI DHIRAJ |
分类号 |
G01R31/3183;G11B20/18;(IPC1-7):H04L1/22;H04B1/74;H02H3/05;H05K10/00;H03K19/003;G06F11/00;G01R31/28 |
主分类号 |
G01R31/3183 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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