发明名称 |
SILICON WAFER HEAT TREATMENT JIG, AND SILICON WAFER HEAT TREATMENT METHOD |
摘要 |
In a silicon wafer heat treatment jig and method, three support arms spaced apart from each other and projecting from a support frame toward a center point have support projections on their upper sides. When a silicon wafer is placed on the support projections and heat-treated in a treating furnace, all the support projections are positioned on the same circumference of the wafer and within a region of 85-99.5% of the radius of the silicon wafer as seen radially outward, individual support arms forming an angle of 120°with respect to the center point. As a result, the transformation free depth starting from a pin site is made greater than in the device-forming region, and the slip-free region with no slip on such wafer surface is made widest. |
申请公布号 |
WO2004088744(A1) |
申请公布日期 |
2004.10.14 |
申请号 |
WO2004JP04508 |
申请日期 |
2004.03.30 |
申请人 |
SUMITOMO MITSUBISHI SILICON CORPORATION;NAKADA, YOSHINOBU;SHIRAKI, HIROYUKI;HASEGAWA, TAKESHI |
发明人 |
NAKADA, YOSHINOBU;SHIRAKI, HIROYUKI;HASEGAWA, TAKESHI |
分类号 |
H01L21/683;H01L21/00;H01L21/26;H01L21/324 |
主分类号 |
H01L21/683 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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