发明名称 Method for processing a substrate for surface treatment, e.g. rinsing, etching, polishing and cleaning, of silicon wafers comprises homogeneously selecting the speed of the process medium along the surface of the substrate
摘要 <p>Method for processing a substrate comprises homogeneously selecting the speed of the process medium along the surface of the substrate. An independent claim is also included for an immersion bath arrangement for processing a substrate.</p>
申请公布号 DE10313692(A1) 申请公布日期 2004.10.14
申请号 DE2003113692 申请日期 2003.03.26
申请人 RIETMANN, WERNER 发明人 RIETMANN, WERNER
分类号 H01L21/00;H01L21/306;(IPC1-7):B01J19/00 主分类号 H01L21/00
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