发明名称 SEMICONDUCTOR DYNAMIC QUANTITY SENSOR
摘要 PROBLEM TO BE SOLVED: To reduce the area of a chip by eliminating a shield electrode in a semiconductor dynamic quantity sensor. SOLUTION: All the outermost electrodes are movable electrodes 2. Even when the outermost movable electrodes come into contact with a beam 4 at the impression of acceleration of a specified value or larger, signal variations do not occur since the movable electrodes and the beam have the same potential. Therefore, shield effects is realized even when the shield electrode 10 is eliminated. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004286624(A) 申请公布日期 2004.10.14
申请号 JP20030079801 申请日期 2003.03.24
申请人 DENSO CORP 发明人 GOTO KEISUKE
分类号 G01P9/04;G01P15/125;H01L29/84;(IPC1-7):G01P15/125 主分类号 G01P9/04
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