发明名称 Bit line contact hole and method for forming the same
摘要 A method of forming a bit line contact hole. After transistors are formed on a substrate, a polysilicon layer conformally covers the transistors and the substrate. The polysilicon layer is defined to form an inner landing pad connecting with a doped region. A passivation layer is formed on the inner landing pad, the transistor and the substrate. An insulating layer with a flat surface is then formed on the passivation layer. A contact opening is formed in the insulating layer and the passivation layer to expose the inner landing pad. MO etching forms a recess of interconnecting landing pad pattern in the upper portion of the contact opening. MO deposition is then performed. The formed bit line contact structure comprises a bottom layer of a polysilicon inner landing pad, a contact plug and a top layer of an interconnected landing pad.
申请公布号 US2004201043(A1) 申请公布日期 2004.10.14
申请号 US20030733984 申请日期 2003.12.11
申请人 MAO HUI-MIN;CHEN YI-NAN 发明人 MAO HUI-MIN;CHEN YI-NAN
分类号 H01L21/302;H01L21/4763;H01L21/60;H01L21/768;H01L21/82;H01L21/8242;H01L27/108;H01L29/94;(IPC1-7):H01L21/82 主分类号 H01L21/302
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