发明名称 |
EXPOSURE APPARATUS AND EXPOSURE SYSTEM EQUIPPED WITH SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide an exposure apparatus which can suppress decrease in the total pitch accuracy to the minimum. SOLUTION: After a drive stage 34 of an exposure stage 32 positions a substrate 51 with a photosensitive material at a first exposure position by moving a chuck stage 33, an irradiation optical system 40 irradiates the substrate 51 with exposure light through a mask 36. Then the drive stage 34 of the exposure stage 32 shifts the chuck stage 33 stepwise in a step shift amount L to position the substrate 51 with the photosensitive material at a second exposure position, and the irradiation optical system 40 irradiates the substrate 51 with exposure light through the mask 36. A controlling apparatus 47 corrects the step shift amount L of the chuck stage 33 on the basis of the temperature of the substrate 51 detected by a temperature detecting apparatus 48 attached to the exposure stage 32. COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2004287026(A) |
申请公布日期 |
2004.10.14 |
申请号 |
JP20030078238 |
申请日期 |
2003.03.20 |
申请人 |
DAINIPPON PRINTING CO LTD |
发明人 |
KAMOTO KENJIRO;SHIMIZU SATOSHI;NADAMOTO NOBUNARI |
分类号 |
G03F7/22;H01L21/027;(IPC1-7):G03F7/22 |
主分类号 |
G03F7/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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