发明名称 HEATER FOR SEMICONDUCTOR MANUFACTURING AND INSPECTING EQUIPMENT
摘要 <p>A ceramic heater for semiconductor manufacturing and inspecting equipment having excellent temperature increase and decrease characteristics, a strong thermal shock in heating and cooling, and excellent uniformity of temperature on a heated surface, comprising heating elements installed on one surface of or inside a substrate, wherein the substrate is formed of a plurality of plate-like segments combined with bar-like segments in circular shape, and heating patterns are provided on the segments independently of each other.</p>
申请公布号 WO2004089039(A1) 申请公布日期 2004.10.14
申请号 WO2003JP04105 申请日期 2003.03.31
申请人 IBIDEN CO., LTD.;SUGIMOTO, KEIZO;ITO, YASUTAKA;OZAKI, JUN 发明人 SUGIMOTO, KEIZO;ITO, YASUTAKA;OZAKI, JUN
分类号 H01L21/00;H05B3/14;(IPC1-7):H05B3/10;H01L21/60;H01L21/02;H05B3/00 主分类号 H01L21/00
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