发明名称 |
HEATER FOR SEMICONDUCTOR MANUFACTURING AND INSPECTING EQUIPMENT |
摘要 |
<p>A ceramic heater for semiconductor manufacturing and inspecting equipment having excellent temperature increase and decrease characteristics, a strong thermal shock in heating and cooling, and excellent uniformity of temperature on a heated surface, comprising heating elements installed on one surface of or inside a substrate, wherein the substrate is formed of a plurality of plate-like segments combined with bar-like segments in circular shape, and heating patterns are provided on the segments independently of each other.</p> |
申请公布号 |
WO2004089039(A1) |
申请公布日期 |
2004.10.14 |
申请号 |
WO2003JP04105 |
申请日期 |
2003.03.31 |
申请人 |
IBIDEN CO., LTD.;SUGIMOTO, KEIZO;ITO, YASUTAKA;OZAKI, JUN |
发明人 |
SUGIMOTO, KEIZO;ITO, YASUTAKA;OZAKI, JUN |
分类号 |
H01L21/00;H05B3/14;(IPC1-7):H05B3/10;H01L21/60;H01L21/02;H05B3/00 |
主分类号 |
H01L21/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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