发明名称 |
Non-binary address generation for ABIST |
摘要 |
Method and system for testing a memory array having a non-uniform binary address space. The test system includes a test engine for generating addresses for the memory array and for generating and applying data patterns to the memory array. The test engine has an address generator including a series combination of a linear register and a binary counter for generating the non-uniform address.
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申请公布号 |
US2004205435(A1) |
申请公布日期 |
2004.10.14 |
申请号 |
US20030413613 |
申请日期 |
2003.04.14 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
KNIPS THOMAS J.;CHANG TOM Y.;DAWSON JAMES W.;MALONE DOUGLAS J. |
分类号 |
G11C29/14;G11C29/20;(IPC1-7):G01R31/28 |
主分类号 |
G11C29/14 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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