| 摘要 |
Disclosed are a method and a device for monitoring an electronic circuit, in which all data of at least one memory can be successively read into and automatically verified in an ECC (error check and correction) unit that can be filled very quickly by the memory without all data having to be transmitted to a processor in a time-consuming process. The ECC testing range encompasses the data of several memory cells of said memory and can be configured as a multiple of the read-word range of the processor. An additional piece of data is formed regarding the data of a certain ECC testing range and can be stored in the memory, allowing the entire code/range of data of the at least one memory to be verified outside the various types of on-going instruction access by filling the entire ECC testing range of the ECC unit, including the additional piece of data, from the memory for each request issued by the processor for the content of a single memory cell. A piece of test data is formed from the data of the entire ECC testing range and is automatically compared with the piece of additional data stored in the ECC unit. |
