发明名称 |
LCD defect identifying apparatus |
摘要 |
A defect identifying apparatus marks a defect location, obviating manual marking in the LCD manufacturing process. The defect identifying apparatus includes a microscope and a defect marker. The defect marker is fastened to a base of the microscope. The defect marker includes an ink jet and a support frame. The support frame is employed to fix the ink jet to the base of the microscope. The ink jet should be positioned between an objective lens and its focal plane so as to avoid scratching the LCD substrate.
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申请公布号 |
US2004201838(A1) |
申请公布日期 |
2004.10.14 |
申请号 |
US20030644519 |
申请日期 |
2003.08.20 |
申请人 |
LEE YU-CHOU;LEE TING-HUI;WANG CHEN-HSIEN |
发明人 |
LEE YU-CHOU;LEE TING-HUI;WANG CHEN-HSIEN |
分类号 |
G01N21/95;G01N21/956;(IPC1-7):G01N21/00 |
主分类号 |
G01N21/95 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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