发明名称 METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE WITH IMPROVED CAPACITANCE
摘要 PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to enhance capacitance by forming a lower electrode with a spacer shape in a contact hole and to simplify the process by patterning simultaneously the lower electrode and an upper electrode. CONSTITUTION: An insulating layer(30) is formed on a semiconductor substrate(21) with a transistor. A contact hole is formed to expose a junction region of the transistor by selectively etching the insulating layer. A lower electrode(34a) with a spacer shape is formed at inner walls of the contact hole. A dielectric film(35) is formed on the lower electrode. Then, an upper electrode(36a) is formed by filling a conductive layer in the contact hole.
申请公布号 KR20040086704(A) 申请公布日期 2004.10.12
申请号 KR20030021061 申请日期 2003.04.03
申请人 MAGNACHIP SEMICONDUCTOR, LTD. 发明人 PARK, JEONG GU
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
代理机构 代理人
主权项
地址