发明名称 |
METHOD FOR MANUFACTURING CAPACITOR OF SEMICONDUCTOR DEVICE WITH IMPROVED CAPACITANCE |
摘要 |
PURPOSE: A method for manufacturing a capacitor of a semiconductor device is provided to enhance capacitance by forming a lower electrode with a spacer shape in a contact hole and to simplify the process by patterning simultaneously the lower electrode and an upper electrode. CONSTITUTION: An insulating layer(30) is formed on a semiconductor substrate(21) with a transistor. A contact hole is formed to expose a junction region of the transistor by selectively etching the insulating layer. A lower electrode(34a) with a spacer shape is formed at inner walls of the contact hole. A dielectric film(35) is formed on the lower electrode. Then, an upper electrode(36a) is formed by filling a conductive layer in the contact hole.
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申请公布号 |
KR20040086704(A) |
申请公布日期 |
2004.10.12 |
申请号 |
KR20030021061 |
申请日期 |
2003.04.03 |
申请人 |
MAGNACHIP SEMICONDUCTOR, LTD. |
发明人 |
PARK, JEONG GU |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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