发明名称 Position detection method and position detector, exposure method and exposure apparatus, and device and device manufacturing method
摘要 A parameter calculation unit statistically calculates the estimations and their certainty of a predetermined number of parameters, which uniquely specify any position on an object, for each of a plurality of measured sample sets on the basis of position information of marks composing the sample set. A valid value calculation unit calculates statistically valid values of the predetermined number of parameters on the basis of groups of the estimations and their certainty of the predetermined number of parameters for the respective sample sets. Furthermore, an evaluation unit statistically evaluates if the number of marks composing a sample set can be reduced. If it is determined that the number of marks can be reduced, the parameter calculation unit calculates values of the predetermined number of parameters by using a new sample set having reduced number of marks. Using the values of the predetermined number of parameters calculated in this manner, the position of any area on the object can be accurately detected.
申请公布号 US6803592(B2) 申请公布日期 2004.10.12
申请号 US20030438870 申请日期 2003.05.16
申请人 NIKON CORPORATION 发明人 YOSHIDA KOUJI
分类号 G03F9/00;(IPC1-7):G01N21/86 主分类号 G03F9/00
代理机构 代理人
主权项
地址