摘要 |
<p>PURPOSE: A semiconductor device and a method for testing the same are provided to divide liquid crystal driving circuits by function to carry out the testing the divisions independently in a short time. CONSTITUTION: A semiconductor device includes a first terminal(DataOut) for outputting testing results of a digital function part to the outside of a liquid crystal driving circuit, and second terminals(Enable,Datain,SCLK) for controlling the test for an analogue part from the outside. The control for a gray level voltage selection circuit(15) is carried out independently from the digital function part at the outside of the LC driving circuit. A conversion element converts an output from a gray level generating circuit(14) included in the analogue function part into 2-value. An output voltage from the gray level generating circuit is converted to 2-value voltage, and each gray level voltage is selectively set to be different 2-value voltage, thereby carrying out the gray level output test at high speed. All the terminals are connected to a tester respectively to carry various tests according to signals output from the tester.</p> |