发明名称 SEMICONDUCTOR DEVICE AND TESTING METHOD THEREOF FOR CARRYING OUT TESTING FOR ANALOGUE AND DIGITAL FUNCTION PARTS INDEPENDENTLY
摘要 <p>PURPOSE: A semiconductor device and a method for testing the same are provided to divide liquid crystal driving circuits by function to carry out the testing the divisions independently in a short time. CONSTITUTION: A semiconductor device includes a first terminal(DataOut) for outputting testing results of a digital function part to the outside of a liquid crystal driving circuit, and second terminals(Enable,Datain,SCLK) for controlling the test for an analogue part from the outside. The control for a gray level voltage selection circuit(15) is carried out independently from the digital function part at the outside of the LC driving circuit. A conversion element converts an output from a gray level generating circuit(14) included in the analogue function part into 2-value. An output voltage from the gray level generating circuit is converted to 2-value voltage, and each gray level voltage is selectively set to be different 2-value voltage, thereby carrying out the gray level output test at high speed. All the terminals are connected to a tester respectively to carry various tests according to signals output from the tester.</p>
申请公布号 KR20040086126(A) 申请公布日期 2004.10.08
申请号 KR20030082102 申请日期 2003.11.19
申请人 RENESAS TECHNOLOGY CORP. 发明人 MAKUUCHI MASAMI;IMAGAWA KENGO;CHUJIYOU NORIO;ORIHASHI RITSURO;ARAI YOSHITOMO;OOBUCHI ATSUSHI
分类号 G01R31/28;G01R31/316;G02F1/13;G02F1/133;G09G3/00;G09G3/20;G09G3/36;G09G5/00;G09G5/39;(IPC1-7):G02F1/13 主分类号 G01R31/28
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