| 摘要 |
PROBLEM TO BE SOLVED: To provide an electron emission characteristic evaluating apparatus capable of quickly knowing the electron emission characteristics of an object irradiated with light while suppressing expenses. SOLUTION: The electron emission characteristic evaluating apparatus 1 provides an input environment for figure data for indicating the shape of an object by an input section 52, and provides a mesh setting environment for setting the state of mesh division through a display by a mesh setting section 53. Further, a light source setting section 54 provides a light source setting environment regarding the state of a light source through the display, and a material setting section 55 provides a material setting environment regarding the material or the surface material of the object. When a user performs these settings, an evaluation output section 56 obtains the flow of electrons accompanying the emission of photoelectrons from the object by obtaining a phenomenon for every basic region composed of mesh units, and expresses the flow of electrons in the entire figure in vector for compositing a figure for outputting by an outputting apparatus as the evaluation result of the electron emission characteristics of the object. COPYRIGHT: (C)2005,JPO&NCIPI |
