发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a semiconductor device having resistor with a stable resistance value and to provide a manufacturing method of the same. <P>SOLUTION: A trench 5 is formed on a semiconductor substrate 1 of a resistor forming region. A resistor 9 and low resistor polysilicon regions 11, 11 are formed through an oxide film 7 in the trench 5. An NSG film 23 and a BPSG film 25 are formed on the entire surface of the semiconductor substrate 1. A metal layer 31 is formed on the BPSG film 25 in correspondence with a forming region of the resistor 9. Since the resistor 9 is formed in the trench 5 formed on the semiconductor substrate 1, a contact area between the resistor 9 and an insulating layer on the resistor 9 can be reduced. Further, since the metal layer 31 is provided through the NSG film 23 and the BPSG film 25 on the resistor 9, the entry of the impurity ion, potential, moisture, or hydrogen or the like from the upper layer side than the metal layer 31 to the resistor 9 can be prevented. Consequently, the resistance value of the resistor 9 can be stabilized. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004281918(A) 申请公布日期 2004.10.07
申请号 JP20030074194 申请日期 2003.03.18
申请人 RICOH CO LTD 发明人 SETO MASAMI;SAKA KIKUO
分类号 H01L23/52;H01L21/3205;H01L21/82;H01L21/822;H01L27/04;(IPC1-7):H01L21/822;H01L21/320 主分类号 H01L23/52
代理机构 代理人
主权项
地址