发明名称 METHOD OF DETECTING DEFECT IN LAMINATED CERAMIC ELECTRONIC PART
摘要 PROBLEM TO BE SOLVED: To provide a method of detecting defects in a laminated ceramic electronic part, which is capable of detecting an ill-insulated layer quickly and precisely. SOLUTION: The laminated ceramic electronic part where the defect detecting method is applied is equipped with terminal electrodes 31 and 32 which are provided to a ceramic base body 1 separated from each other by a certain distance in the lengthwise direction X. Electrode films 20 to 29 are embedded in the ceramic base body 1, and overlapped with each other interposing a ceramic layer between them in the direction Z of thickness of the ceramic base body 1. One end of either of the adjacent electrode films is connected to one of the terminal electrodes 31 and 32, and one end of the other of the adjacent electrode films is connected to the other of the terminal electrodes 31 and 32. When a defective laminated ceramic electronic part is detected, the terminal electrode 32 is removed, the film end faces of the electrode films 21, 23, 25, 27, and 29 connected to the terminal electrode 32 are exposed to the outside. Furthermore, the other terminal electrode 31 is subjected to electroplating as it is electrically connected to an electroplating cathode 52. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004281536(A) 申请公布日期 2004.10.07
申请号 JP20030068267 申请日期 2003.03.13
申请人 TDK CORP 发明人 UEDA KANAME;YURI SHUNICHI
分类号 H01G4/12;H01G13/00;(IPC1-7):H01G13/00 主分类号 H01G4/12
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