发明名称 Test system including a test circuit board including resistive devices
摘要 A test system includes a device under test and a test circuit board. The device under test includes a plurality of contacts configured to provide output signals. The test circuit board may convey the output signals from the device under test to an analyzer. The test circuit board may include a dielectric layer, a via extending through the dielectric layer, a conductor formed on the dielectric layer and a resistive annular ring having a predetermined resistance value. The resistive annular ring may be formed around the via and may be electrically coupled between the via and the conductor.
申请公布号 US2004199844(A1) 申请公布日期 2004.10.07
申请号 US20030408705 申请日期 2003.04.07
申请人 SUN MICROSYSTEMS, INC. 发明人 WELBON EDWARD HUGH;MOORE ROY STUART
分类号 G01R31/28;G01R31/319;H05K1/02;H05K1/11;H05K1/16;(IPC1-7):G06F11/00 主分类号 G01R31/28
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