Apparatus, for analysis of frozen samples of polar ice, and detection of spatial trace elements, has control software to position direct-light microscope and laser optical column alternately over sample

摘要

Apparatus for analysis of frozen samples using a laser has a Gaussian-coupled resonator and a highly reflective back mirror. The optical column has an enlargement lens and a high aperture laser lens. A direct-light microscope has a direct light polarizing unit and a coupled charge device camera. The optical column and the microscope are on a table with movement in the X-direction. The apparatus for analysis of frozen samples using a laser (2), for the detection of spatial trace element distribution patterns, has a Gaussian-coupled resonator (4) and a highly reflective back mirror (5). The optical column (11) has an enlargement lens (6) and a high aperture laser lens (3). A direct-light microscope (7), parallel to the optical column, has a direct light polarizing unit (8) and a coupled charge device (CCD) camera (13). The optical column and the microscope are mounted together at a table (10) with movement in the X-direction. The control system has a special control software (14) to position the optical column and the microscope alternately over the frozen sample (9).