发明名称 |
SUBSTANCE IDENTIFICATION SYSTEM |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To simplify manual work carried out conventionally by a measuring person to identify a substance precisely and quickly. <P>SOLUTION: An electron beam apparatus has an electron beam diffraction image analyzing part 3 for calculating lattice spacing based on a diffraction image taken in by a TV camera 10 for observing the electron beam diffraction image, an EDX analyzing part 2 connected to an EDX detector 9 to find a substance composition, and a substance identifying part 4 provided with a database for retrieval for identifying the substance and a database retrieving function. The substance identifying part 4 retrieves the database for the retrieval to identify the substance, based on a lattice spacing data transmitted from the electron beam diffraction image analyzing part 3, and an element data transmitted from the EDX analyzing part 2. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004279328(A) |
申请公布日期 |
2004.10.07 |
申请号 |
JP20030073932 |
申请日期 |
2003.03.18 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP;HITACHI SCI SYST LTD |
发明人 |
YAGUCHI NORIE;UENO TAKEO;TANIGUCHI YOSHIFUMI |
分类号 |
G01N23/20;G01N23/225;H01J37/252;H01J37/256;H01J37/26;H01J37/295;(IPC1-7):G01N23/225 |
主分类号 |
G01N23/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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