发明名称 SUBSTANCE IDENTIFICATION SYSTEM
摘要 <p><P>PROBLEM TO BE SOLVED: To simplify manual work carried out conventionally by a measuring person to identify a substance precisely and quickly. <P>SOLUTION: An electron beam apparatus has an electron beam diffraction image analyzing part 3 for calculating lattice spacing based on a diffraction image taken in by a TV camera 10 for observing the electron beam diffraction image, an EDX analyzing part 2 connected to an EDX detector 9 to find a substance composition, and a substance identifying part 4 provided with a database for retrieval for identifying the substance and a database retrieving function. The substance identifying part 4 retrieves the database for the retrieval to identify the substance, based on a lattice spacing data transmitted from the electron beam diffraction image analyzing part 3, and an element data transmitted from the EDX analyzing part 2. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004279328(A) 申请公布日期 2004.10.07
申请号 JP20030073932 申请日期 2003.03.18
申请人 HITACHI HIGH-TECHNOLOGIES CORP;HITACHI SCI SYST LTD 发明人 YAGUCHI NORIE;UENO TAKEO;TANIGUCHI YOSHIFUMI
分类号 G01N23/20;G01N23/225;H01J37/252;H01J37/256;H01J37/26;H01J37/295;(IPC1-7):G01N23/225 主分类号 G01N23/20
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