| 摘要 |
PROBLEM TO BE SOLVED: To provide a magnetic force microscope capable of performing quantitative magnetic measurement at a local spot by a new-generation magnetic application element having high density, and knowing a dynamic characteristic by an external magnetic field at the local spot, without requiring an operator to do troublesome works for setting operation, data collection, and data processing analysis. SOLUTION: This magnetic force microscope is equipped with a cantilever having a micro-probe equipped with a greater coercive force on the tip than the maximum external magnetic field, a means for detecting displacement of the cantilever, a means for vibrating the distance between the cantilever and a sample in a fixed cycle with a desired amplitude quantity. a moving means for moving the sample relatively to the probe, an external magnetic field device comprising an electromagnet capable of applying a magnetic field perpendicular or in parallel to the sample, a means for sweeping the direction and the magnitude of the magnetic field, and a synchronous amplifier for outputting an MFM signal synchronously with the external magnetic field. COPYRIGHT: (C)2005,JPO&NCIPI
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