| 摘要 |
The invention relates to a method for testing semiconductor devices, to a system including at least one socket or adapter device, and to a socket or adapter device, in particular for semiconductor devices, having at least one connection pin which is designed such that it is adapted to be introduced into a corresponding contact device of a device to which the socket or adapter device is to be connected, wherein the connection pin is designed such that a clamping connection is provided between the contact device and the connection pin when the connection pin is introduced into the contact device.
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