| 摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a method for evaluating an organic material in several-namometer order. <P>SOLUTION: The device and the method are provided for evaluating the organic material in several-namometer order, which are not established in conventional technology. In particular, information about energy in a transition process for the organic material between electron levels is obtained with a space resolution of several namometer or less from the direction of the surface or the cross section, and it is also applicable for the evaluation of the interface condition of heterogeneous substances when bonded to each other. For example, the gradient or charged condition of a potential on the interface between an electrode and a organic layer of a semiconductor organic material or an organic luminescent device is evaluated and a band diagram of an element is drawn in accordance with its result, thus actualizing high-degree functional development of the element. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
