发明名称 SEMICONDUCTOR DEVICE, CAPABLE OF ENDURING EASILY IMPACT, AND MANUFACTURING METHOD THEREOF
摘要 PURPOSE: A semiconductor device and a manufacturing method thereof are provided to obtain a high resistance of the impact generated from a packaging process by improving remarkably the strength of a pad region in the semiconductor device using a silicon oxide layer with a relatively high strength compared to a low-k film. CONSTITUTION: A low-k film(11) with a relative dielectric constant of 3 or less is formed on a substrate(1) with a pad region(A) and a circuit region(B). An insulating layer(15) with a relatively high strength compared to the low-k film is formed in the low-k film of the pad region. The insulating layer is made of a silicon oxide layer. A plurality of multilayer metal lines are formed in the insulating layer of the pad region and the low-k film of the circuit region, respectively. A bonding pad is formed on the uppermost layer of each multilayer metal line.
申请公布号 KR20040084983(A) 申请公布日期 2004.10.07
申请号 KR20040020563 申请日期 2004.03.26
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. 发明人 SHIN HONG JAE
分类号 H01L23/52;H01L21/3205;H01L21/768;H01L23/485;H01L23/532 主分类号 H01L23/52
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