发明名称 |
SEMICONDUCTOR DEVICE, CAPABLE OF ENDURING EASILY IMPACT, AND MANUFACTURING METHOD THEREOF |
摘要 |
PURPOSE: A semiconductor device and a manufacturing method thereof are provided to obtain a high resistance of the impact generated from a packaging process by improving remarkably the strength of a pad region in the semiconductor device using a silicon oxide layer with a relatively high strength compared to a low-k film. CONSTITUTION: A low-k film(11) with a relative dielectric constant of 3 or less is formed on a substrate(1) with a pad region(A) and a circuit region(B). An insulating layer(15) with a relatively high strength compared to the low-k film is formed in the low-k film of the pad region. The insulating layer is made of a silicon oxide layer. A plurality of multilayer metal lines are formed in the insulating layer of the pad region and the low-k film of the circuit region, respectively. A bonding pad is formed on the uppermost layer of each multilayer metal line. |
申请公布号 |
KR20040084983(A) |
申请公布日期 |
2004.10.07 |
申请号 |
KR20040020563 |
申请日期 |
2004.03.26 |
申请人 |
SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. |
发明人 |
SHIN HONG JAE |
分类号 |
H01L23/52;H01L21/3205;H01L21/768;H01L23/485;H01L23/532 |
主分类号 |
H01L23/52 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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