发明名称 |
SEMICONDUCTOR SUBSTRATE, MANUFACTURING METHOD THEREFOR, SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREFOR |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a semiconductor substrate having an excellent partial SOI structure in which an SOI region has a sufficient gettering capacity to an adjacent non-SOI region (a bulk region) and the bulk region (an element formable region) is not narrowed. <P>SOLUTION: One main surface of the first single-crystal silicon layer 3 of the semiconductor substrate 11 is covered partially, and an Si0<SB>2</SB>film 4 as an insulating layer is formed. A region not covered with the film 4 in the single-crystal silicon layer 5 and the edge of the film 4 adjacent to the region are covered, and a second single-crystal silicon layer 5 is formed partially. A polycrystalline silicon layer 6 as an unsingle-crystal silicon layer is formed on the film 4. The polycrystalline silicon layer 6 is formed while an interface with the layer 5 is positioned at the upper section of the film 4. <P>COPYRIGHT: (C)2005,JPO&NCIPI |
申请公布号 |
JP2004281781(A) |
申请公布日期 |
2004.10.07 |
申请号 |
JP20030072218 |
申请日期 |
2003.03.17 |
申请人 |
TOSHIBA CORP |
发明人 |
NAGANO HAJIME;MIYANO KIYOTAKA;MIZUSHIMA ICHIRO |
分类号 |
H01L21/74;H01L21/00;H01L21/02;H01L21/20;H01L21/322;H01L21/336;H01L21/76;H01L21/762;H01L21/8242;H01L21/84;H01L27/01;H01L27/10;H01L27/108;H01L27/12;H01L29/786 |
主分类号 |
H01L21/74 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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