发明名称 X-RAY FOREIGN MATTER INSPECTION SYSTEM
摘要 <p><P>PROBLEM TO BE SOLVED: To provide an X-ray foreign matter inspection system capable of collating an article determined to have foreign matter contamination with image analysis data more easily and efficiently than hitherto. <P>SOLUTION: An X-ray foreign matter inspection device 1 is equipped with an image analytical means 15 for determining whether a foreign matter is contaminated inside or not by using fluoroscopic information of an inspection object W. The device is provided with a radio transmission port 15a and a transmission means for transmitting analysis data to the outside through the port 15a, and is equipped with a portable information terminal 3 equipped with a radio transmission port 3a for receiving the transmitted analysis data. Therefore, the contamination position or the like of the foreign matter can be verified easily and efficiently by bringing the portable information terminal 3 to a place of the article W determined to have foreign matter contamination and removed and by referring to the pertinent data. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004279116(A) 申请公布日期 2004.10.07
申请号 JP20030068485 申请日期 2003.03.13
申请人 SHIMADZU CORP 发明人 WATANABE YUJI;TOTTORI YUKINORI
分类号 G01N23/04;(IPC1-7):G01N23/04 主分类号 G01N23/04
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