发明名称 ION ADHESION MASS SPECTROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide an ion mass spectroscope capable of sorting metal ion and adhesive ion, preventing the metal ion from being transported to a mass spectrometer, preventing generation and boosting of background as well as generation of a ghost signal, and improving measurement accuracy of the adhesive ion. SOLUTION: The ion adhesion mass spectroscope generates adhesive ion attached by attaching positive charge metal ion to a molecule of a target measured material in an adhesion area 12, transports the adhesive ion from the adhesion area 12 to the mass spectrometer 25, then proceeds mass spectroscopy of the adhesive ion with the mass spectrometer 25. The device is structured to be provided with a magnetic field 22 having a filtering function of passing the adhesive ion and not passing the metal ion, between the adhesion area 12 and the mass spectrometer 25. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004281269(A) 申请公布日期 2004.10.07
申请号 JP20030072169 申请日期 2003.03.17
申请人 ANELVA CORP 发明人 HIRANO YOSHIKI;SHIOKAWA YOSHIRO
分类号 G01N27/62;H01J49/06;H01J49/10;H01J49/26;(IPC1-7):H01J49/06 主分类号 G01N27/62
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