发明名称 TEST APPARATUS
摘要 <p>A test apparatus for testing electric devices, comprising a test module for sending/receiving test signals to/from electric devices; a test head having a plurality of TH slots for removably holding the test module; a diagnosis module for performing diagnosis of the test module; and performance boards connected to respective ones of the plurality of TH slots and having a plurality of PB slots for removably holding the diagnosis module. A predetermined diagnosis module held by a predetermined PB slot diagnoses a predetermined test module held by a predetermined TH slot electrically connected to the predetermined PB slot.</p>
申请公布号 WO2004086071(A1) 申请公布日期 2004.10.07
申请号 WO2004JP03651 申请日期 2004.03.18
申请人 ADVANTEST CORPORATION;SHIBUYA, ATSUNORI 发明人 SHIBUYA, ATSUNORI
分类号 G01R31/28;G01R31/319;G01R35/00;(IPC1-7):G01R31/318 主分类号 G01R31/28
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