发明名称 |
FIELD-EFFECT TRANSISTOR AND ITS MANUFACTURING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a field-effect transistor which improves FET characteristics and which can remarkably simplify its manufacturing steps in a method for manufacturing the field-effect transistor having an SOI (Si-On-Insulator) structure and a strained Si channel layer, and to provide a method for manufacturing the same. SOLUTION: The field-effect transistor having the SOI structure and the strained Si channel layer can improve the FET characteristics and can remarkably simplify its manufacturing steps by using a crystalline metal oxide having a different lattice interval from the Si. The method for manufacturing the same is provided. COPYRIGHT: (C)2005,JPO&NCIPI
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申请公布号 |
JP2004281594(A) |
申请公布日期 |
2004.10.07 |
申请号 |
JP20030069148 |
申请日期 |
2003.03.14 |
申请人 |
TOSHIBA CORP |
发明人 |
NISHIKAWA YUKIE;FUKUSHIMA SHIN;MATSUSHITA DAISUKE;SATAKE HIDEKI |
分类号 |
H01L29/786;H01L21/336;(IPC1-7):H01L29/786 |
主分类号 |
H01L29/786 |
代理机构 |
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地址 |
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