发明名称 [SPLIT GATE FLASH MEMORY CELL AND MANUFACUTIRNG METHOD THEREOF]
摘要 A split gate flash memory cell includes a substrate having a trench, a stack structure disposed on the substrate, wherein the stack structure includes a tunneling dielectric layer, a floating gate and a cap layer; a first inter-gate dielectric layer and a second inter-gate dielectric layer disposed on the sidewalls of the stack structure, wherein the first inter-gate dielectric layer is contiguous to the top of the trench; a selective gate disposed on the sidwalls of the first inter-gate dielectric layer and the trench; a selective gate dielectric layer disposed between the selective gate and the substrate; a source region configured in the substrate beside the side of the stack structure with the second inter-gate dielectric layer; and a drain region configured at the bottom of the trench beside one side of the selective gate.
申请公布号 US2004197999(A1) 申请公布日期 2004.10.07
申请号 US20040709309 申请日期 2004.04.28
申请人 CHANG KO-HSING;HSU HANN-JYE 发明人 CHANG KO-HSING;HSU HANN-JYE
分类号 H01L21/8247;H01L29/423;H01L29/788;(IPC1-7):H01L21/76 主分类号 H01L21/8247
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