| 摘要 |
PROBLEM TO BE SOLVED: To cut down externally attached components to reduce the cost, to optimally measure the capacity, irrespective of the material of a secondary cell or the system model, to improve the measuring accuracy and the battery control accuracy, and to take the environment into account. SOLUTION: The semiconductor device for measuring the capacity of a secondary cell has: a secondary cell protector circuit having a circuit for observing the condition of the secondary cell in a load current feed time (discharging) or a charge current feeding time (charging); and a circuit for outputting the observation result as an external signal. The observing circuit for the cell and the external signal generating circuit for outputting as the observation result have each one or more reference voltage generator circuits 408, sense voltage generator circuits 406, constant current circuits 407, voltage comparators 405, delay circuits 404, and logic circuits 403, respectively. COPYRIGHT: (C)2005,JPO&NCIPI
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