| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device capable of preventing malfunction of a POR (power on reset) circuit and stably executing a test mode. SOLUTION: A test mode signal TM is inputted from a test mode determining circuit 30 to the POR circuit 25 in the test mode for testing the operation of an internal circuit. Thereby, a reset signal ZPOR transmitted from the POR circuit 25 is forcefully fixed at an "H" level. According to this, it is possible to halt the transmission of the reset signal POR, created from the POR circuit 25 due to a malfunction at the test mode, to the internal circuit, and execute stable tests. COPYRIGHT: (C)2005,JPO&NCIPI
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