| 摘要 |
In an ultrasonic inspection apparatus, a piezoelectric element having a first resonant frequency is stuck to a complex resonance member having a second resonant frequency. The second resonant frequency is determined with a conversion in terms of half wavelength. A resultant ultrasonic probe transmits/receives ultrasonic waves of the first resonant frequency and a plurality of other frequencies. In constructing an ultrasonic tomographic image of the object to be inspected from a received signal obtained by using the ultrasonic probe, the imaging frequency is changed according to the depth in the object to be inspected. |
