发明名称 LITHOGRAPHIC APPARATUS, DEVICE MANUFACTURING METHOD, AND DEVICE MANUFACTURED THEREBY
摘要 PROBLEM TO BE SOLVED: To reduce the exposure of a resist on a substrate to contaminants. SOLUTION: A chamber 10 enclosing a substrate table WT and the substrate for the exposure are prepared. Between the chamber 10 and a processing unit 11 which processes the substrate after the exposure, the substrate is transferred in a substantially contaminant free environment to minimize the exposure to the contaminants of the resist on the substrate. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004274024(A) 申请公布日期 2004.09.30
申请号 JP20030345025 申请日期 2003.08.27
申请人 ASML NETHERLANDS BV 发明人 SCHENAU KOEN VAN INGEN
分类号 G03F7/20;H01L21/027;H01L21/677;(IPC1-7):H01L21/027;H01L21/68 主分类号 G03F7/20
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