发明名称 METHOD OF MANUFACTURING RETICLE BLANK
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a method of manufacturing a reticle blank having a strut structure which has uniform and sufficient stiffness on the whole reticle surface. <P>SOLUTION: A resist 24 is applied onto the rear face of a silicon support substrate 21 and patterned, and patterns 24a-24c are formed. Etching work is repeated while shielding plates are exchanged in order of 1a, 1b, 1c on the patterns 24a-24c. Finally, etching is performed without a shielding plate. Apertures 10a-10c which correspond to distribution of etch rate in membrane regions are arranged on the shielding plates 1a-1c, respectively. By using the shielding plates, the etching time duration of each part is so adjusted that the progressing condition of etching becomes equal all over membrane part. <P>COPYRIGHT: (C)2004,JPO&NCIPI</p>
申请公布号 JP2004273580(A) 申请公布日期 2004.09.30
申请号 JP20030059313 申请日期 2003.03.06
申请人 NIKON CORP 发明人 KATAKURA NORIHIRO
分类号 G03F1/20;H01L21/027;(IPC1-7):H01L21/027;G03F1/16 主分类号 G03F1/20
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