发明名称 Method for controlling PH during planarization and cleaning of microelectronic substrates
摘要 A method and apparatus for processing a microelectronic substrate. In one embodiment, the method can include planarizing the microelectronic substrate with a planarizing liquid and rinsing the substrate with a rinsing liquid having a pH approximately the same as a pH of the planarizing liquid. The rinsing step can be completed while the substrate remains on a polishing pad of the apparatus, or, alternatively, the substrate can be removed to a rinsing chamber for rinsing. In another embodiment, the method can include conditioning the polishing pad by removing polishing pad material from the polishing pad and then cleaning the microelectronic substrate by engaging the substrate with the same polishing pad and moving at least one of the polishing pad and the substrate relative to the other of the polishing pad and the substrate after conditioning the polishing pad.
申请公布号 US2004192174(A1) 申请公布日期 2004.09.30
申请号 US20040806765 申请日期 2004.03.22
申请人 发明人 SHARPLES JUDSON R.;ZACHARIAS KENNETH F.;HUDSON GUY F.
分类号 B24B37/04;B24B49/00;B24B57/02;H01L21/306;(IPC1-7):B24B1/00;B24B7/19 主分类号 B24B37/04
代理机构 代理人
主权项
地址