发明名称 Vapor-phase growth method, semiconductor manufacturing method and semiconductor device manufacturing method
摘要 In a vapor-phase growth method in which a silicon-germanium mixed crystal layer is deposited on a semiconductor substrate, the vapor-phase growth method comprises a first step of introducing silicon raw material gas into a reaction furnace in such a manner that a silicon raw material gas partial pressure increases in proportion to a time to thereby deposit a first semiconductor layer of a silicon layer on the semiconductor substrate under reduced pressure, a second step of introducing silicon raw material gas and germanium raw material gas into the reaction furnace in such a manner that a desired germanium concentration may be obtained to thereby deposit a second semiconductor layer of a silicon-germanium mixed crystal layer on the first semiconductor layer under reduced pressure and a third step of introducing silicon raw material gas into the reaction furnace under reduced pressure to thereby deposit a third semiconductor layer of a silicon layer on the second semiconductor layer. Thus, there can be obtained a semiconductor layer in which a misfit dislocation can be improved.
申请公布号 US2004191960(A1) 申请公布日期 2004.09.30
申请号 US20040818821 申请日期 2004.04.06
申请人 发明人 YAMAGATA HIDEO;KOUMOTO TAKEYOSHI;ATSUUMI KENJI;NEGORO YOICHI;HIRATA TATSUSHIRO;NOGUCHI TAKASHI
分类号 C30B25/02;H01L21/20;H01L21/205;H01L21/331;(IPC1-7):H01L21/44 主分类号 C30B25/02
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