发明名称 MASK FOR VAPOR DEPOSITION
摘要 PROBLEM TO BE SOLVED: To provide a mask for vapor deposition, which can cope with highly precise patterning by correcting nonuniformity such as a temperature change and a temperature distribution due to an effect of radiant heat, in order to remove the adverse effect of the radiant heat on pattern location accuracy. SOLUTION: The mask for vapor deposition comprises a thin platy main body 1 having an aperture 1b formed into a shape corresponding to the vapor deposition pattern, and a frame 2 for retaining the main body 1 of the mask, wherein insulation members 5 and 6 for insulating the heat radiating from a vapor deposition source is arranged on a vapor deposition source side of the frame 2, or a heat radiation member 9 for radiating the heat received by the frame 2 from the vapor deposition source is arranged on the opposite side of the vapor deposition source in the frame 2. COPYRIGHT: (C)2004,JPO&NCIPI
申请公布号 JP2004269968(A) 申请公布日期 2004.09.30
申请号 JP20030062915 申请日期 2003.03.10
申请人 SONY CORP 发明人 NAGASAKI HIDEO;KAMIYAMA ISAO
分类号 H05B33/10;C23C14/04;C23C14/12;H01L51/50;H05B33/14;(IPC1-7):C23C14/04 主分类号 H05B33/10
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